IC Test Engineering
Caliber Interconnects stands as a pre-eminent test service provider
within the semiconductor industry across various markets.
Post Silicon Validation Services
Caliber Interconnects delivers deep-domain expertise and robust infrastructure to support every phase of the semiconductor test life cycle. We provide a fully integrated, end-to-end solution under one roof—ensuring a seamless and efficient IC validation journey.
Our comprehensive post-silicon validation services ensure that your designs are functionally robust, performance-optimized, and fully production-ready. With deep expertise in both software and hardware deliverables, we support the complete semiconductor test cycle seamlessly bridging the gap between New Product Introduction (NPI) and High Volume Manufacturing (HVM).Â
Whether leveraging Automatic Test Equipment (ATE) or bench test systems, we work with your preferred platforms to provide turnkey, adaptable solutions that integrate seamlessly into your workflow—accelerating time to market while enhancing performance and reliability.
All Under One Roof
Silicon Validation Services
* NPI bring up
* Prototype testing for IPs
* Reusable and time to market test supports Onsite/Offsite post silicon validation(IC test Engineering) Support
* In-house development centre designed to achieve high quality products backed by cost effective services
Product Experience
* Defence
* Consumer
* IoT
* Sensors
* Industrial
* AIML
Resources
*NI/R&S based bench test setup
*Dedicated Research and development team for innovation and excellence
Skills & Specializations
* Test time reduction technique implementation.
* Single site to multi site conversion
* EDA to ATE(Automated Test Equipment) vector conversion.
* Cross tester platform conversion
* Throughput enhancement.
* Scripting for automation.
* Data analysis for product engineering.
Highlights of post-silicon
- End-to-End Validation from wafer to final test.
- Continuous performance optimization for improved efficiency.
- Comprehensive system-level testing and integration.
- Advanced debugging and root cause analysis.
- Expertise and state-of-the-art testing facilities.
- Extensive experience across various semiconductor domains.
- Established validation methodologies and best practices.
- Cross functional teams with hardware and software expertise.
End To End Solutions
Feasibility Study & test plan development
Feasibility study ensures DUT
compatibility with ATE by evaluating electrical, timing, and resource requirements for efficient testing. A detailed Test Plan Matrix is then crafted to address functional, parametric, and corner-case coverage aligned with production goals
Hardware Design for Test
Powering precision from the ground up—our expert team crafts tailored test solutions, from platform selection to
custom hardware, ensuring flawless DUT-to-ATE integration every time.
Test Program Development & Debugging
Test programs are optimized to align with the Test Plan Matrix and are rigorously validated using known-good devices to
ensure accuracy and consistency. By refining test flows and methodologies, we achieve reliable parametric measurements, enhance overall test efficiency, and minimize cycle time—ultimately supporting high-quality, cost-effective manufacturing.
Product Characterization & Correlation
Post-silicon parametric and functional characterization is performed across critical temperature and voltage corners
to assess device performance under varying conditions. Comprehensive correlation of bench, simulation, and ATE
results is conducted to ensure
measurement accuracy, consistency and alignment with design specifications, validating both functionality and integrity.
Multi-site development & Debugging
In multi-site testing, we maximize throughput by testing multiple devices simultaneously, ensuring consistent results and faster time-to-market. Our thorough debugging across all sites resolves issues early, optimizing resources, reducing test time, and enhancing validation reliability.
Product qualification & Production release
Product qualification ensures devices meet functional, parametric, and reliability standards through rigorous
testing. Post-qualification, optimized test programs drive efficient ramp-up, quality
control, and yield maximization, with continuous monitoring for consistent performance in mass production.
SoC: Functional Validation
Processor, Graphics, Sensors, Memory & High Speed Interfaces
Domain Expertise
- Ethernet switch, LVDS Buffer, Transceiver etc.,
- RAM (SRAM, DRAM, SDRAM), FLASH (NOR, NAND), EEPROM
- High speed and high precision ADC/DACs
- MOSFET, IGBT and diodes
- Ultra High-Speed line Scan images Sensors,Area Scan Image Sensors, MEMS-Motion Sensor, Automotive Grade Sensors
